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Silicon Odometers: Compact In-situ Aging Sensors for Robust System Design
Found in: IEEE Micro
By Xiaofei Wang,John Keane,Tony Tae-Hyoung Kim,Pulkit Jain,Qianying Tang,Chris H. Kim
Issue Date:February 2014
pp. 1
Circuit reliability issues such as Bias Temperature Instability (BTI), Hot Carrier Injection (HCI), Time Dependent Dielectric Breakdown (TDDB) Electromigration (EM), and Random Telegraph Noise (RTN) have become a growing concern with technology scaling. Pr...