Designing fault tolerant FSM by nano-PLA
On-Line Testing Symposium, IEEE International
By S. Baranov, I. Levin, O. Keren, M. Karpovsky
Issue Date:June 2009
The paper deals with designing fault tolerant finite state machines (FSMs) by nanoelectronic programmable logic arrays (PLAs). Two main critical parameters of the fault tolerant nano-PLAs, the area and the number of crosspoint devices, are considered as op...