Comparing transient-fault effects on synchronous and on asynchronous circuits
On-Line Testing Symposium, IEEE International
By R. Possamai Bastos, Y. Monnet, G. Sicard, F. Kastensmidt, M. Renaudin, R. Reis
Issue Date:June 2009
A methodology to evaluate transient-fault effects on synchronous and asynchronous is presented in this work. It is developed by means of fault-injection simulation campaigns on gate-level circuit implementations. The methodology is able to deal with the pa...