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Comparing transient-fault effects on synchronous and on asynchronous circuits
Found in: On-Line Testing Symposium, IEEE International
By R. Possamai Bastos, Y. Monnet, G. Sicard, F. Kastensmidt, M. Renaudin, R. Reis
Issue Date:June 2009
pp. 29-34
A methodology to evaluate transient-fault effects on synchronous and asynchronous is presented in this work. It is developed by means of fault-injection simulation campaigns on gate-level circuit implementations. The methodology is able to deal with the pa...
A bulk built-in sensor for detection of fault attacks
Found in: 2013 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST)
By R. Possamai Bastos,F. Sill Torres,J.-M. Dutertre,M.-L. Flottes,G. Di Natale,B. Rouzeyre
Issue Date:June 2013
pp. 51-54
This work presents a novel scheme of built-in current sensor (BICS) for detecting transient fault-based attacks of short and long duration as well as from different simultaneous sources. The new sensor is a single mechanism connected to PMOS and NMOS bulks...