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Two-Dimensional Layout Migration by Soft Constraint Satisfaction
Found in: Quality Electronic Design, International Symposium on
By Qianying Tang, Jianwen Zhu
Issue Date:March 2005
pp. 35-39
Layout migration has re-emerged as an important task due to the increasing use of library hard intellectual properties. While recent advances of migration tools have accommodated new metrics, the underlying engine is based on the one-dimensional (1-D) layo...
 
Silicon Odometers: Compact In-situ Aging Sensors for Robust System Design
Found in: IEEE Micro
By Xiaofei Wang,John Keane,Tony Tae-Hyoung Kim,Pulkit Jain,Qianying Tang,Chris H. Kim
Issue Date:February 2014
pp. 1
Circuit reliability issues such as Bias Temperature Instability (BTI), Hot Carrier Injection (HCI), Time Dependent Dielectric Breakdown (TDDB) Electromigration (EM), and Random Telegraph Noise (RTN) have become a growing concern with technology scaling. Pr...
 
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