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Analysis of the extra delay on interconnects caused by resistive opens and shorts
Found in: On-Line Testing Symposium, IEEE International
By Pablo Maqueda, Josep Rius
Issue Date:June 2009
pp. 208-209
The paper presents an analytical solution for the delay introduced by opens and shorts on RC interconnects. Starting from the set of PDEs that defines the dynamics of such lines, complete solutions are found. Compact expressions for the delay, derived from...
 
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