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Displaying 1-10 out of 10 total
Neutron detection in atmospheric environment through static and dynamic SRAM-based test bench
Found in: Latin American Test Workshop
By L. Dilillo,P. Rech,J.-M Galliere,P. Girard,F. Wrobel,F. Saigne
Issue Date:March 2011
pp. 1-6
In this paper, we propose a technique for the detection of neutrons in atmospheric environment developed in the framework of HAMLET project. This technique relies on the sensitivity of SRAM cells to particle radiation. In particular, we introduce a system ...
Evaluating Alpha-induced soft errors in embedded microprocessors
Found in: On-Line Testing Symposium, IEEE International
By P. Rech, S. Gerardin, A. Paccagnella, P. Bernardi, M. Grosso, M. Sonza Reorda, D. Appello
Issue Date:June 2009
pp. 69-74
This paper presents the results of Alpha Single Event Upsets tests of an embedded 8051 microprocessor. Cross sections for the different memory resources (i.e., internal registers, code RAM, and user memory) are reported as well as the error rate for differ...
A Memory Fault Simulator for Radiation-Induced Effects in SRAMs
Found in: Asian Test Symposium
By P. Rech, A. Bosio, P. Girard, S. Pravossoudovitch, A. Virazel, L. Dilillo
Issue Date:December 2010
pp. 100-105
This paper introduces a simulator that allows analyzing the radiation induced errors on memory devices. The simulator takes all the radiation effects on SRAM into account and can be easily tuned on the base of data gained during radiation experiments and/o...
DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study
Found in: VLSI Test Symposium, IEEE
By D. Appello, P. Bernardi, S. Gerardin, M. Grosso, A. Paccagnella, P. Rech, M. Sonza Reorda
Issue Date:May 2009
pp. 276-281
This paper proposes an efficient low-cost strategy for collecting data during radiation experiments on Systems-on-Chips (SoCs), exploiting the available on-chip Design for Testability (DfT) structures devised for manufacturing test.The approach combines ha...
Impact of GPUs Parallelism Management on Safety-Critical and HPC Applications Reliability
Found in: 2014 44th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)
By P. Rech,L.L. Pilla,P.O.A. Navaux,L. Carro
Issue Date:June 2014
pp. 455-466
Graphics Processing Units (GPUs) offer high computational power but require high scheduling strain to manage parallel processes, which increases the GPU cross section. The results of extensive neutron radiation experiments performed on NVIDIA GPUs confirm ...
Analysis of root causes of alpha sensitivity variations on microprocessors manufactured using different cell layouts
Found in: On-Line Testing Symposium, IEEE International
By P. Rech, M. Grosso, F. Melchiori, D. Loparco, D. Appello, L. Dilillo, A. Paccagnella, M. Sonza Reorda
Issue Date:July 2010
pp. 29-34
This paper reports and analyzes the results of alpha radiation testing campaigns on an embedded microprocessor manufactured with different standard cell libraries, each one enforcing Design for Manufacturing rules at a specific level. A set of analog simul...
Sensitivity evaluation of TMR-hardened circuits to multiple SEUs induced by alpha particles in commercial SRAM-based FPGAs
Found in: Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
By A. Manuzzato, P. Rech, S. Gerardin, A. Paccagnella, L. Sterpone, M. Violante
Issue Date:September 2007
pp. 79-86
We present an experimental analysis of the sensitivity of SRAM-based FPGAs to alpha particles. We study how the different resources inside the FPGA (LUTs, MUXs, PIPs, etc. ) are affected by alpha-induced SEUs, assessing the cross section for the configurat...
Neutron radiation test of graphic processing units
Found in: 2012 IEEE 18th International On-Line Testing Symposium (IOLTS 2012)
By P. Rech,C. Aguiar,R. Ferreira,C. Frost,L. Carro
Issue Date:June 2012
pp. 55-60
This paper reports and analyzes the results of neutrons radiation testing campaigns on a modern commercial-off-the-shelf Graphic Processing Unit (GPU). A set of guidelines for accelerated radiation experiments on CPUs is presented, emphasizing the shrewdne...
Experimental evaluation of thread distribution effects on multiple output errors in GPUs
Found in: 2013 18th IEEE European Test Symposium (ETS)
By P. Rech,C. Aguiar,C. Frost,L. Carro
Issue Date:May 2013
pp. 1-6
Graphic Processing Units are very prone to be corrupted by neutrons. Experimental results show that in the majority of the cases a typical application like matrix multiplication is affected by multiple output errors. In this paper we evaluate how different...
Neutron sensitivity of integer and floating point operations executed in GPUs
Found in: 2013 14th Latin American Test Workshop - LATW
By P. Rech,C. Aguiar,C. Frost,L. Carro
Issue Date:April 2013
pp. 1-6
Graphics Processing Units are very prone to be corrupted by neutrons. Experimental results obtained irradiating the GPU with high energy neutrons show that the input data type has a strong influence on the neutron-induced error rate of the executed algorit...