Using test infrastructures for (remote) online evaluation of the sensitivity to SEUs of FPGAs
On-Line Testing Symposium, IEEE International
By Andre V. Fidalgo, Gustavo R. Alves, Manuel C. Felgueiras, Manuel G. Gericota
Issue Date:June 2009
SRAM-based Field Programmable Gate Arrays (FPGAs) endured a considerable evolution in the last few years, both in terms of density and complexity, with nanometre technology being currently used in their manufacturing. However, the exponential growth of the...