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Employing the STDF V4-2007 Standard for Scan Test Data Logging
Found in: IEEE Design & Test of Computers
By M. Seuring,M. Braun,A. Ma,G. Eide,K. Yang, Huaxing Tang
Issue Date:December 2012
pp. 91-99
This paper focuses on the V4-2007 extension of the Standard Test Data Format (STDF). STDF has been used as the standard representation for logging test data from automatic test equipment (ATE). This format however lacked a key capability, i.e., storing sca...
 
A Structural Approach for Space Compaction for Sequential Circuits
Found in: Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
By M. Seuring, M. Gössel
Issue Date:November 1999
pp. 227
In this paper a new structural method for linear output space compaction for synchronous sequential circuits is presented. Based on simple estimates for the probabilities of the existence of sensitized paths from the signal lines to the circuit outputs, op...
 
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