LCTI-SS: Low-Clock-Tree-Impact Scan Segmentation for Avoiding Shift Timing Failures in Scan Testing
IEEE Design & Test of Computers
By Y. Yamato,X. Wen,M. Kochte,K. Miyase,S. Kajihara,L. Wang
Issue Date:October 2012
Moving further into the deep-submicron era, the problem of test-induced yield loss due to high power consumption has increasingly worsened. One of the major causes of this problem is shift timing failure, which arises from excessive switching activity in t...