Tracking Nanostructural Evolution in Alloys: Large-Scale Analysis of Atom Probe Tomography Data on Blue Gene/L
Parallel Processing, International Conference on
By Sudip Seal, Michael Moody, Anna Ceguerra, Simon Ringer, Krishna Rajan, Srinivas Aluru
Issue Date:September 2008
The advent of Local Electrode Atom Probe (LEAP) tomography is revolutionizing materials science by enabling near atomic scale imaging of materials. Analysis of three-dimensional atom probe tomography (APT) data holds the promise of relating combinatorial a...