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Displaying 1-9 out of 9 total
Burst Transmission for Energy-Efficient Ethernet
Found in: IEEE Internet Computing
By Pedro Reviriego, Jose-Alberto Hernadez, David Larrabeiti, Juan Antonio Maestro
Issue Date:July 2010
pp. 50-57
The proposed Energy-Efficient Ethernet (EEE) standard reduces energy consumption by defining two operation modes for transmitters and receivers: active and low power. Burst transmission can provide additional energy savings when EEE is used. Collecting dat...
 
Low Power embedded DRAM caches using BCH code partitioning
Found in: 2012 IEEE 18th International On-Line Testing Symposium (IOLTS 2012)
By Pedro Reviriego,Alfonso Sanchez-Macian,Juan Antonio Maestro
Issue Date:June 2012
pp. 79-83
Technology advances have recently enabled the use of DRAMs into logic integrated circuits. These embedded DRAMs can be used to efficiently implement caches since DRAMs require substantially less area than SRAMs. One challenge for DRAM based caches is that ...
 
Low Complexity Concurrent Error Detection for Complex Multiplication
Found in: IEEE Transactions on Computers
By Salvatore Pontarelli,Pedro Reviriego,Chris J. Bleakley,Juan Antonio Maestro
Issue Date:September 2013
pp. 1899-1903
This paper studies the problem of designing a low complexity Concurrent Error Detection (CED) circuit for the complex multiplication function commonly used in Digital Signal Processing circuits. Five novel CED architectures are proposed and their computati...
 
Offset DMR: A Low Overhead Soft Error Detection and Correction Technique for Transform-Based Convolution
Found in: IEEE Transactions on Computers
By Pedro Reviriego,Chris Bleakley,Juan Antonio Maestro,Anne O'Donnell
Issue Date:October 2011
pp. 1511-1516
A novel concurrent soft error detection and correction scheme is introduced for parallel hardware implementations of transform-based convolution. The proposed technique is based on the structure of radix-2 Fast Fourier Transforms (FFT) of length 2^{n} wher...
 
Soft error detection and correction for FFT based convolution using different block lengths
Found in: On-Line Testing Symposium, IEEE International
By Pedro Reviriego, Juan Antonio Maestro, Anne O'Donnell, Chris J. Bleakley
Issue Date:June 2009
pp. 138-143
The structure of radix-2 Fast Fourier Transforms of length 2<sup>n</sup> where n is an integer is used to propose a new soft error detection and correction scheme for transform based convolution. The scheme can provide up to 100% detection and ...
 
Low Delay Single Symbol Error Correction Codes based on Reed Solomon Codes
Found in: IEEE Transactions on Computers
By Salvatore Pontarelli,Pedro Reviriego,Marco Ottavi,Juan Antonio Maestro
Issue Date:May 2014
pp. 1
To avoid data corruption, Error Correction Codes (ECCs) are widely used to protect memories. ECCs introduce a delay penalty in accessing the data as encoding or decoding has to be performed. This limits the use of ECCs in high-speed memories. This has led ...
 
Reliability analysis of memories protected with BICS and a per-word parity bit
Found in: ACM Transactions on Design Automation of Electronic Systems (TODAES)
By Chris J. Bleakley, Juan Antonio Maestro, Pedro Reviriego
Issue Date:February 2010
pp. 1-15
This article presents an analysis of the reliability of memories protected with Built-in Current Sensors (BICS) and a per-word parity bit when exposed to Single Event Upsets (SEUs). Reliability is characterized by Mean Time to Failure (MTTF) for which two ...
     
Efficient error detection codes for multiple-bit upset correction in SRAMs with BICS
Found in: ACM Transactions on Design Automation of Electronic Systems (TODAES)
By Juan Antonio Maestro, Pedro Reviriego
Issue Date:January 2009
pp. 1-10
Memories are one of the most widely used elements in electronic systems, and their reliability when exposed to Single Events Upsets (SEUs) has been studied extensively. As transistor sizes shrink, Multiple Bits Upsets (MBUs) are becoming an increasingly im...
     
Study of the effects of MBUs on the reliability of a 150 nm SRAM device
Found in: Proceedings of the 45th annual conference on Design automation (DAC '08)
By Juan Antonio Maestro, Pedro Reviriego
Issue Date:June 2008
pp. 1-30
Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event Upsets (SEUs), Multiple Bit Upsets (MBUs) are becoming more and more important ...
     
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