Search For:

Displaying 1-9 out of 9 total
C2MS: Dynamic Monitoring and Management of Cloud Infrastructures
Found in: 2013 IEEE 5th International Conference on Cloud Computing Technology and Science (CloudCom)
By Gary A. McGilvary,Josep Rius,Inigo Goiri,Francesc Solsona,Adam Barker,Malcolm Atkinson
Issue Date:December 2013
pp. 290-297
Server clustering is a common design principle employed by many organisations who require high availability, scalability and easier management of their infrastructure. Servers are typically clustered according to the service they provide whether it be the ...
A method for detecting resistive opens in buses
Found in: On-Line Testing Symposium, IEEE International
By Josep Rius
Issue Date:July 2010
pp. 187-189
The method is based on the modification of bus connectivity to force bus oscillation during testing. The oscillation frequency depends on the open resistance and location on the line. Comparison of the frequency with a reference allows the detection and ev...
A New Reliable Proposal to Manage Dynamic Resources in a Computing P2P System
Found in: Parallel, Distributed, and Network-Based Processing, Euromicro Conference on
By Damià Castellà Martínez, Josep Rius Torrento, Ignasi Barri Vilardell, Francesc Giné de Sola, Francesc Solsona Tehàs
Issue Date:February 2009
pp. 323-329
Peer-to-Peer (P2P) computing, the harnessing of idle compute cycles through the Internet, allows computing resources from ordinary users to be shared in an open access. In this framework, the dynamic resource management offers new research challenges in th...
Built-in Current Sensor for ∆I{DDQ} Testing of Deep Submicron Digital CMOS ICs
Found in: VLSI Test Symposium, IEEE
By Josep Rius Vázquez, José Pineda de Gyvez
Issue Date:April 2004
pp. 53
This paper presents the implementation of a built-in current sensor that includes two recently reported new techniques for I{DDQ} testing to take into account the increased background current of defect-free circuits and its increased variance due to proces...
Power Supply Noise Monitor for Signal Integrity Faults
Found in: Design, Automation and Test in Europe Conference and Exhibition
By Josep Rius Vázquez, José Pineda de Gyvez
Issue Date:February 2004
pp. 21406
We propose a monitor able to detect on-line excessive Power Supply Noise (PSN) at the power/ground lines. It has high resolution (100 ps), enough to collect the important features of PSN and its output is isolated from the local PSN. It is useful for any s...
Comparison of I<sub>DDQ</sub> Testing and Very-Low Voltage Testing
Found in: Test Conference, International
By Bram Kruseman, Stefan van den Oetelaar, Josep Rius
Issue Date:October 2002
pp. 964
I<sub>DDQ</sub> testing is a well-known test method to filter dies with reliability risks. However, the test method is endangered by the increase in off-state current in advanced process technologies. An alternative for detecting resistive shor...
Analysis of the extra delay on interconnects caused by resistive opens and shorts
Found in: On-Line Testing Symposium, IEEE International
By Pablo Maqueda, Josep Rius
Issue Date:June 2009
pp. 208-209
The paper presents an analytical solution for the delay introduced by opens and shorts on RC interconnects. Starting from the set of PDEs that defines the dynamics of such lines, complete solutions are found. Compact expressions for the delay, derived from...
A Voltage-Mode Testing Method to Detect IDDQ Defects in Digital Circuits
Found in: European Test Symposium, IEEE
By Josep Rius, Luis Elvira Villagra, Maurice Meijer
Issue Date:May 2009
pp. 135-140
A novel method to detect a defective IDDQ on top of highbackground current is proposed. Instead of the conventionalapproach that measures the quiescent current drawn by thecircuit-under-test (CUT), the proposed method is based on themeasurement of the volt...
Exploring the combination of IDDQ and iDDt testing: energy testing
Found in: Proceedings of the conference on Design, automation and test in Europe (DATE '99)
By Joan Figueras, Josep Rius
Issue Date:January 1999
pp. 110-es
In this paper, we consider the new and evocative work on tangible interfaces and the issues this raises in the light of some old lessons of HCI. In doing so, we make the point that many of these lessons of good design still apply, even when we are consider...