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Displaying 1-17 out of 17 total
Situation Assessment and Decision Making Integrated into the Process Centered Environment
Found in: Engineering of Computer-Based Systems, IEEE International Conference on the
By Stephanie White, Susan Dorchak, John Keane, William Pallack, Jerry Owens, Jerzy Rozenblit, James Davis, Janos Sztipanovits
Issue Date:March 1999
pp. 129
Researchers have defined a number of process modeling methods and have developed in-roads to process-centered environments that support process modeling and project control. However, there is little research that incorporates variability of the human condi...
 
The effects of applying cell-suppression and perturbation to aggregated genetic data
Found in: 2012 IEEE 12th International Conference on Bioinformatics & Bioengineering (BIBE)
By Athos Antoniades,John Keane,Aristos Aristodimou,Christa Philipou,Andreas Constantinou,Christos Georgousopoulos,Federica Tozzi,Kyriacos Kyriacou,Andreas Hadjisavvas,Maria Loizidou,Christiana Demetriou,Constantinos Pattichis
Issue Date:November 2012
pp. 644-649
The key test for confidence in any association discovered within the medical domain is replication testing. That is, the ability of the association to be detected in independent populations. At the same time, in order to increase the likelihood of discover...
 
A multi-story power delivery technique for 3D integrated circuits
Found in: Low Power Electronics and Design, International Symposium on
By Pulkit Jain, Tae-Hyoung Kim, John Keane, Chris H. Kim
Issue Date:August 2008
pp. 57-62
Integrating circuits in the vertical direction can alleviate interconnect related problems and enable heterogeneous chips to be stacked in a single package with a small form factor. This paper addresses the power delivery issues in 3D chips revealing some ...
 
An on-chip NBTI sensor for measuring PMOS threshold voltage degradation
Found in: Low Power Electronics and Design, International Symposium on
By John Keane, Tae-Hyoung Kim, Chris H. Kim
Issue Date:August 2007
pp. 189-194
Negative Bias Temperature Instability (NBTI) is one of the most critical device reliability issues facing scaled CMOS technology. In order to better understand the characteristics of this mechanism, accurate and efficient means of measuring its effects mus...
 
Dynamic Data Integration Using Web Services
Found in: Web Services, IEEE International Conference on
By Fujun Zhu, Mark Turner, Ioannis Kotsiopoulos, Keith Bennett, Michelle Russell, David Budgen, Pearl Brereton, John Keane, Paul Layzell, Michael Rigby, Jie Xu
Issue Date:June 2004
pp. 262
We address the problem of large-scale data integration, where the data sources are unknown at design time, are from autonomous organisations, and may evolve. Experiments are described involving a demonstrator system in the field of health services data int...
 
Using Web Service Technologies to Create an Information Broker: An Experience Report
Found in: Software Engineering, International Conference on
By Mark Turner, Fujun Zhu, Ioannis Kotsiopoulos, Michelle Russell, David Budgen, Keith Bennett, Pearl Brereton, John Keane, Paul Layzell, Michael Rigby
Issue Date:May 2004
pp. 552-561
This paper reports on our experiences with using the emerging web service technologies and tools to create a demonstration information broker system as part of our research into information management in a distributed environment. To provide a realistic co...
 
IBHIS: Integration Broker for Heterogeneous Information Sources
Found in: Computer Software and Applications Conference, Annual International
By Ioannis Kotsiopoulos, John Keane, Mark Turner, Paul Layzell, Fujun Zhu
Issue Date:November 2003
pp. 378
Effective use of heterogeneous, distributed information in a coherent, integrated fashion has long been a 'holy grail'. The UK Health and Social care domain is an example where a global view is needed to facilitate decision making, whilst having ethical an...
 
Collecting Cyclic Garbage in Distributed Systems
Found in: Parallel Architectures, Algorithms, and Networks, International Symposium on
By Xinfeng Ye, John Keane
Issue Date:December 1997
pp. 227
The proposed garbage collection scheme identifies and collects cycles of garbage scattered across several machines. The scheme identifies a garbage cycle by investigating: (a) whether the transitive closure of a given object form a cycle, and (b) whether o...
 
A Three-Layer Model for Schema Management in Federated
Found in: Hawaii International Conference on System Sciences
By Mark Roantree, John Keane
Issue Date:January 1997
pp. 44
This paper describes our use of object technology to provide a framework for interoperability between databases. We are particularly interested in controlling the effects on the federation of schema modification in local databases. We describe two informal...
   
Silicon Odometers: Compact In-situ Aging Sensors for Robust System Design
Found in: IEEE Micro
By Xiaofei Wang,John Keane,Tony Tae-Hyoung Kim,Pulkit Jain,Qianying Tang,Chris H. Kim
Issue Date:February 2014
pp. 1
Circuit reliability issues such as Bias Temperature Instability (BTI), Hot Carrier Injection (HCI), Time Dependent Dielectric Breakdown (TDDB) Electromigration (EM), and Random Telegraph Noise (RTN) have become a growing concern with technology scaling. Pr...
 
Querying phenotype-genotype associations across multiple knowledge bases using Semantic Web technologies
Found in: 2013 IEEE 13th International Conference on Bioinformatics and Bioengineering (BIBE)
By Oya Deniz Beyan,Aftab Iqbal,Yasar Khan,Athos Antoniades,John Keane,Panagiotis Hasapis,Christos Georgousopoulos,Myrto Ioannidi,Stefan Decker,Ratnesh Sahay
Issue Date:November 2013
pp. 1-5
Biomedical and genomic data are inherently heterogeneous and their recent proliferation over the Web has demanded innovative querying methods to help domain experts in their clinical and research studies. In this paper we present the use of Semantic Web te...
   
A multi-story power delivery technique for 3D integrated circuits
Found in: Proceeding of the thirteenth international symposium on Low power electronics and design (ISLPED '08)
By Chris H. Kim, John Keane, Pulkit Jain, Tae-Hyoung Kim
Issue Date:August 2008
pp. 383-384
Integrating circuits in the vertical direction can alleviate interconnect related problems and enable heterogeneous chips to be stacked in a single package with a small form factor. This paper addresses the power delivery issues in 3D chips revealing some ...
     
An on-chip NBTI sensor for measuring PMOS threshold voltage degradation
Found in: Proceedings of the 2007 international symposium on Low power electronics and design (ISLPED '07)
By Chris H. Kim, John Keane, Tae-Hyoung Kim
Issue Date:August 2007
pp. 189-194
Negative Bias Temperature Instability (NBTI) is one of the most critical device reliability issues facing scaled CMOS technology. In order to better understand the characteristics of this mechanism, accurate and efficient means of measuring its effects mus...
     
Modeling and analysis of leakage induced damping effect in low voltage LSIs
Found in: Proceedings of the 2006 international symposium on Low power electronics and design (ISLPED '06)
By Chris Kim, Jie Gu, John Keane
Issue Date:October 2006
pp. 382-387
Although there has been extensive research on controlling leakage power, the fact that leaky transistors can act as a damping element for supply noise has been long ignored or unnoticed in the design community. This paper investigates the leakage induced d...
     
Utilizing reverse short channel effect for optimal subthreshold circuit design
Found in: Proceedings of the 2006 international symposium on Low power electronics and design (ISLPED '06)
By Chris Kim, Hanyong Eom, John Keane, Tae-Hyoung Kim
Issue Date:October 2006
pp. 127-130
The impact of the Reverse Short Channel Effect (RSCE) on device current is stronger in the subthreshold region due to the reduced Drain-Induced-Barrier-Lowering (DIBL) and the exponential dependency of current on threshold voltage. This paper describes a d...
     
Subthreshold logical effort: a systematic framework for optimal subthreshold device sizing
Found in: Proceedings of the 43rd annual conference on Design automation (DAC '06)
By Chris Kim, Hanyong Eom, John Keane, Sachin Sapatnekar, Tae-Hyoung Kim
Issue Date:July 2006
pp. 425-428
Subthreshold circuit designs have been demonstrated to be a successful alternative when ultra-low power consumption is paramount. However, the characteristics of MOS transistors in the subthreshold regime are significantly different from those in strong-in...
     
Proximity within paragraph: a measure to enhance eocument retrieval performance
Found in: Proceedings of the 15th international conference on World Wide Web (WWW '06)
By John A. Keane, Srisupa Palakvangsa-Na-Ayudhya
Issue Date:May 2006
pp. 1033-1034
We created a proximity measure, called Proximity Within Paragraph (PWP), which is based on the concept of value assignment to queried words, grouped by associated ideas within paragraphs. Based on the WT10G dataset, a test system comprising three test sets...
     
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