Built-in aging monitoring for safety-critical applications
On-Line Testing Symposium, IEEE International
By J.C. Vazquez, V. Champac, A.M. Ziesemer, R. Reis, I.C. Teixeira, M.B. Santos, J.P. Teixeira
Issue Date:June 2009
Complex electronic systems for safety or mission-critical applications (automotive, space) must operate for many years in harsh environments. Reliability issues are worsening with device scaling down, while performance and quality requirements are increasi...