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Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example
Found in: 2011 Design, Automation & Test in Europe
By H Hashempour,J Dohmen,Bratislav Tasić,B Kruseman,C Hora,M van Beurden, Yizi Xing
Issue Date:March 2011
pp. 1-6
We present an application of Defect Oriented Testing (DOT 1 ) to an industrial mixed signal device to reduce test time and maintain quality. The device is an automotive IC product with stringent quality requirements and a mature test program that is alread...
   
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