Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example
2011 Design, Automation & Test in Europe
By H Hashempour,J Dohmen,Bratislav Tasić,B Kruseman,C Hora,M van Beurden, Yizi Xing
Issue Date:March 2011
We present an application of Defect Oriented Testing (DOT 1 ) to an industrial mixed signal device to reduce test time and maintain quality. The device is an automotive IC product with stringent quality requirements and a mature test program that is alread...