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A Persistent Diagnostic Technique for Unstable Defects
Found in: Test Conference, International
By Yasuo Sato, Iwao Yamazaki, Hiroki Yamanaka, Toshio Ikeda, Masahiro Takakura
Issue Date:October 2002
pp. 242
We present a persistent diagnostic technique for unstable defects, such as open defects or delay defects. A new
Sparc64 VIIIfx: A New-Generation Octocore Processor for Petascale Computing
Found in: IEEE Micro
By Takumi Maruyama, Toshio Yoshida, Ryuji Kan, Iwao Yamazaki, Shuji Yamamura, Noriyuki Takahashi, Mikio Hondou, Hiroshi Okano
Issue Date:March 2010
pp. 30-40
<p>The Sparc64 VIIIfx eight-core processor, developed for use in petascale computing systems, runs at speeds of up to 2 GHz and achieves a peak performance of 128 gigaflops while consuming as little as 58 watts of power. Sparc64 VIIIfx realizes a six...
An Approach to Improve the Resolution of Defect-Based Diagnosis
Found in: Asian Test Symposium
By Iwao Yamazaki, Hiroki Yamanaka, Toshio Ikeda, Masahiro Takakura, Yasuo Sato
Issue Date:November 2001
pp. 123
This paper presents a practical approach to improve the resolution of defect-based diagnosis. To diagnose the faulty chips, various techniques are needed as well as modeling the defects precisely. In this paper, some techniques using the layout information...
An Evaluation of Defect-Oriented Test: WELL-controlled Low Voltage Test
Found in: Test Conference, International
By Yasuo Sato, Masaki Kohno, Toshio Ikeda, Iwao Yamazaki, Masato Hamamoto
Issue Date:November 2001
pp. 1059
This paper presents an evaluation of defect-oriented test that targets bridging defects or leakage defects in the deep sub-micron process. As the power supply voltage or the threshold voltage (Vt) decreases, the detection of these defects becomes more diff...