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Aging analysis of circuit timing considering NBTI and HCI
Found in: On-Line Testing Symposium, IEEE International
By Dominik Lorenz, Georg Georgakos, Ulf Schlichtmann
Issue Date:June 2009
pp. 3-8
We present an aging analysis flow able to calculate the degraded circuit timing. To the best of our knowledge it is the first approach on gate level so far capable of analyzing the impact of the two dominant drift-related aging effects - NBTI and HCI - on ...
 
Soft Error Rates in 65nm SRAMs--Analysis of new Phenomena
Found in: On-Line Testing Symposium, IEEE International
By Franz X. Ruckerbauer, Georg Georgakos
Issue Date:July 2007
pp. 203-204
Soft error rates measured on embedded SRAMs in a 65nm CMOS technology show a significant increase of the error rate induced by neutron radiation (NSER), while the number of soft errors due to alpha radiation (ASER) is within the expected range. In this pap...
   
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