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Design techniques and tradeoffs in implementing non-destructive field test using logic BIST self-test
Found in: On-Line Testing Symposium, IEEE International
By Amit Dutta, Malav Shah, G. Swathi, Rubin A. Parekhji
Issue Date:June 2009
pp. 237-242
Periodic testing of electronic devices on the field during application execution is becoming increasingly important. In addition, some of these applications are embedded and real-time, requiring the system to be operational for extended periods. In such ap...
 
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