Search For:

Displaying 1-1 out of 1 total
Employing the STDF V4-2007 Standard for Scan Test Data Logging
Found in: IEEE Design & Test of Computers
By M. Seuring,M. Braun,A. Ma,G. Eide,K. Yang, Huaxing Tang
Issue Date:December 2012
pp. 91-99
This paper focuses on the V4-2007 extension of the Standard Test Data Format (STDF). STDF has been used as the standard representation for logging test data from automatic test equipment (ATE). This format however lacked a key capability, i.e., storing sca...
 
 1