OpenDFM Bridging the Gap Between DRC and DFM
IEEE Design & Test of Computers
By J. Buurma,R. Sayah,F. Valente,C. Rodgers
Issue Date:December 2012
This paper presents the details of a standard, named OpenDFM, which describes an efficient method to ensure manufacturability of integrated circuits that are designed at advanced technology nodes of today and one that can scale to address similar issues at...