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Application-oriented SEU sensitiveness analysis of Atmel rad-hard FPGAs
Found in: On-Line Testing Symposium, IEEE International
By N. Battezzati, F. Decuzzi, M. Violante, M. Briet
Issue Date:June 2009
pp. 89-94
Radiation-hardened-by-design (RHBD) SRAM-based FPGAs will play a crucial role in providing new generations of satellites with reliable in-flight reconfiguration ability, which is mandatory to enable the successful use of configurable computing in space. RH...
 
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