Variation of SRAM Alpha-Induced Soft Error Rate with Technology Node
On-Line Testing Symposium, IEEE International
By Damien Leroy, Rémi Gaillard, Erwin Schaefer, Cyrille Beltrando, Shi-Jie Wen, Richard Wong
Issue Date:July 2008
This document presents a compilation of results from tests performed by iRoC Technologies on SER induced by alpha particles on SRAM memories for technology nodes from 180nm to 65nm. The aim of this study is to establish the variation of sensitivity with te...