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Highs and lows of radiation testing
Found in: On-Line Testing Symposium, IEEE International
By Dan Alexandrescu, Anne-Lise Lhomme-Perrot, Erwin Schaefer, Cyrille Beltrando
Issue Date:June 2009
pp. 179
The presentation concerns a practical approach for dealing with difficulties associated to real time testing in a natural environment of microelectronic devices.
 
Variation of SRAM Alpha-Induced Soft Error Rate with Technology Node
Found in: On-Line Testing Symposium, IEEE International
By Damien Leroy, RĂ©mi Gaillard, Erwin Schaefer, Cyrille Beltrando, Shi-Jie Wen, Richard Wong
Issue Date:July 2008
pp. 253-257
This document presents a compilation of results from tests performed by iRoC Technologies on SER induced by alpha particles on SRAM memories for technology nodes from 180nm to 65nm. The aim of this study is to establish the variation of sensitivity with te...
 
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