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Displaying 1-4 out of 4 total
On-Chip IDDQ Testing in the AE11 Fail-Stop Controller
Found in: IEEE Design and Test of Computers
By Eberhard Böhl, Thomas Lindenkreuz, Matthias Meerwein
Issue Date:October 1998
pp. 57-65
The development of the Fail-Stop Controller AE11 aimed at the replacement of the classic safety structure, using two identical controllers, by a single controller with various online fault detection measures. Target applications are high-volume products li...
#SAT-based vulnerability analysis of security components — A case study
Found in: 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
By Linus Feiten,Matthias Sauer,Tobias Schubert,Alexander Czutro,Eberhard Bohl,Ilia Polian,Bernd Becker
Issue Date:October 2012
pp. 49-54
In this paper we describe a new approach to assess a circuit's vulnerability to fault attacks. This is achieved through analysis of the circuit's design specification, making use of modern SAT solving techniques. For each injectable fault, a corresponding ...
Nonlinear compression functions using the MISR approach for security purposes in automotive applications
Found in: On-Line Testing Symposium, IEEE International
By Eberhard Bohl, Paul Duplys
Issue Date:June 2009
pp. 55-60
In order to ensure data integrity of continuously provided signals often a compression function is needed in combination with encryption. This compression can be performed by a cryptographic hash function, which needs a lot of circuitry and/or memory and i...
Linear and nonlinear MISR operations for safety and security in automotive applications
Found in: On-Line Testing Symposium, IEEE International
By Paul Duplys, Eberhard Bohl
Issue Date:June 2009
pp. 187-188
We present an low-cost enhancement to a standard MISR design for safety and security purposes in automotive applications. Depending on the application, the MISR is enhanced by either a linear or a nonlinear code generator presented in this paper. Linear co...