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Enhanced self-configurability and yield in multicore grids
Found in: On-Line Testing Symposium, IEEE International
By E. Kolonis, M. Nicolaidis, D. Gizopoulos, M. Psarakis, J.H. Collet, P. Zajac
Issue Date:June 2009
pp. 75-80
As we move deeper in the nanotechnology era, computer architecture is solicited to manipulate tremendous numbers of devices per chip with high defect densities. These trends provide new computing opportunities but efficiently exploiting them will require a...