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Hazard detection in combinational and sequential switching circuits
Found in: Foundations of Computer Science, Annual IEEE Symposium on
By E. B. Eichelberger
Issue Date:November 1964
pp. 111-120
No summary available.
 
A logic design structure for LSI testability
Found in: Papers on Twenty-five years of electronic design automation (25 years of DAC)
By E. B. Eichelberger, T. W. Williams
Issue Date:June 1988
pp. 358-364
This paper describes an experiment in which parallel routing is performed on a medium grained hypercube parallel processor having 64 processing elements. Each node is a complete 32-bit computer with 128 K-bytes of memory and is connected to the other nodes...
     
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