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Aging analysis of circuit timing considering NBTI and HCI
Found in: On-Line Testing Symposium, IEEE International
By Dominik Lorenz, Georg Georgakos, Ulf Schlichtmann
Issue Date:June 2009
pp. 3-8
We present an aging analysis flow able to calculate the degraded circuit timing. To the best of our knowledge it is the first approach on gate level so far capable of analyzing the impact of the two dominant drift-related aging effects - NBTI and HCI - on ...
 
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