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Multiple-Valued Memory Design by Standard BiCMOS Technique
Found in: Computer Science and Information Engineering, World Congress on
By Dong-Shong Liang, Kwang-Jow Gan, Jenq-Jong Lu, Cheng-Chi Tai, Cher-Shiung Tsai, Geng-Huang Lan, Yaw-Hwang Chen
Issue Date:April 2009
pp. 596-599
A novel multiple-valued memory circuit design using multiple-peak negative differential resistance (NDR) circuit based on standard SiGe process is demonstrated. The NDR circuit is designed based on the combination of metal-oxide-semiconductor field-effect-...
A Novel Multiphysics Sensoring Method Based on Thermal and EC Techniques and Its Application for Crack Inspection
Found in: Sensor Networks, Ubiquitous, and Trustworthy Computing, International Conference on
By Cheng-Chi Tai, Yen-Lin Pan
Issue Date:June 2008
pp. 475-479
Crack inspection is a critical issue in quantitative nondestructive evaluation (NDE). The eddy current (EC) method is effective for surface discontinuities detection, but the spatial resolution of conventional EC method is constrained by the size of EC pro...