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Invariant checkers: An efficient low cost technique for run-time transient errors detection
Found in: On-Line Testing Symposium, IEEE International
By Carmela Noro Grando, Carlos Arthur Lisboa, Alvaro Freitas Moreira, Luigi Carro
Issue Date:June 2009
pp. 35-40
Semiconductor technology evolution brings along higher soft error rates and long duration transients, which require new low cost system level approaches for error detection and mitigation. Known software based error detection techniques imply a high overhe...