Search For:

Displaying 1-4 out of 4 total
Improving reliability for bit parallel finite field multipliers using Decimal Hamming
Found in: IEEE East-West Design & Test Symposium (EWDTS 2010)
By N Mavrogiannakis,C Argyrides,D K Pradhan
Issue Date:September 2010
pp. 69-72
Technology evolution dictates ever increasing density of transistors in chips, lower power consumption and higher performance. In such environment occurrence of multiple-bit upsets (MBUs) is a concern. That, together with the presence of fault-related atta...
A fast error correction technique for matrix multiplication algorithms
Found in: On-Line Testing Symposium, IEEE International
By C. Argyrides, C. A. L. Lisboa, D. K. Pradhan, L. Carro
Issue Date:June 2009
pp. 133-137
Temporal redundancy techniques will no longer be able to cope with radiation induced soft errors in technologies beyond the 45 nm node, because transients will last longer than the cycle time of circuits. The use of spatial redundancy techniques will also ...
Multiple Bit Error Detection and Correction in Memory
Found in: Digital Systems Design, Euromicro Symposium on
By J.F. Tarillo, N. Mavrogiannakis, C.A. Lisboa, C. Argyrides, L. Carro
Issue Date:September 2010
pp. 652-657
Technology evolution provides ever increasing density of transistors in chips, lower power consumption and higher performance. In this environment the occurrence of multiple-bit upsets (MBUs) becomes a significant concern. Critical applications need high r...
Reliability aware yield improvement technique for nanotechnology based circuits
Found in: Proceedings of the 22nd Annual Symposium on Integrated Circuits and System Design: Chip on the Dunes (SBCCI '09)
By C. A. Lisboa, C. Argyrides, D. K. Pradhan, G. Dimosthenous, L. Carro
Issue Date:August 2009
pp. 1-6
Lithography based IC manufacturing is approaching its physical limits in terms of feature size. In this scenario, nanotechnology based manufacturing, relying on self-assembly of nanotubes or nanowires, has been predicted as an alternative to CMOS technolog...