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Advances in variation-aware modeling, verification, and testing of analog ICs
Found in: 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012)
By Dimitri De Jonghe,E. Maricau,G. Gielen,T. McConaghy,B. Tasic,H. Stratigopoulos
Issue Date:March 2012
pp. 1615-1620
This tutorial paper describes novel scalable, nonlinear/generic, and industrially-oriented approaches to perform variation-aware modeling, verification, fault simulation, and testing of analog/custom ICs. In the first section, Dimitri De Jonghe, Elie Maric...
 
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