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Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages
Found in: VLSI Test Symposium, IEEE
By D. Arumi, R. Rodriguez-Montanes, J. Figueras, S. Eichenberger, C. Hora, B. Kruseman, M. Lousberg, A.K. Majhi
Issue Date:May 2007
pp. 145-150
Improvement of diagnosis methodologies is a key factor for fast failure analysis and yield improvement. As bridging defects are a common defect type in CMOS circuits, diagnosing this class of defect becomes relevant for present and future technologies. Bri...
 
Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example
Found in: 2011 Design, Automation & Test in Europe
By H Hashempour,J Dohmen,Bratislav Tasić,B Kruseman,C Hora,M van Beurden, Yizi Xing
Issue Date:March 2011
pp. 1-6
We present an application of Defect Oriented Testing (DOT 1 ) to an industrial mixed signal device to reduce test time and maintain quality. The device is an automotive IC product with stringent quality requirements and a mature test program that is alread...
   
Diagnosis of Full Open Defects in Interconnecting Lines
Found in: VLSI Test Symposium, IEEE
By R. Rodriguez-Montanes, D. Arumi, J. Figueras, S. Einchenberger, C. Hora, B. Kruseman, M. Lousberg, A.K. Majhi
Issue Date:May 2007
pp. 158-166
A proposal for enhancing the diagnosis of full open defects in interconnecting lines of CMOS circuits is presented. The defective line is first classified as fully opened by means of a logic-based diagnosis tool (Faloc). The proposal is based on the divisi...
 
On test conditions for the detection of open defects
Found in: Design, Automation and Test in Europe Conference and Exhibition
By B. Kruseman, M. Heiligers
Issue Date:March 2006
pp. 191
The impact of test conditions on the detectability of open defects is investigated. We performed an inductive fault analysis on representative standard gates. The simulation results show that open-like defects result in a wide range of different voltage-de...
 
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