CS Store Search
Displaying 1-4 out of 4 total
Workload Characterization for Software Aging Analysis
Software Reliability Engineering, International Symposium on
By Antonio Bovenzi,Domenico Cotroneo,Roberto Pietrantuono,Stefano Russo
Issue Date:December 2011
The phenomenon of software aging is increasingly recognized as a relevant problem of long-running systems. Numerous experiments have been carried out in the last decade to empirically analyze software aging. Such experiments, besides highlighting the relev...
An OS-level Framework for Anomaly Detection in Complex Software Systems
IEEE Transactions on Dependable and Secure Computing
By Antonio Bovenzi,Francesco Brancati,Stefano Russo,Andrea Bondavalli
Issue Date:July 2014
Revealing anomalies at the operating system (OS) level to support online diagnosis activities of complex software systems is a promising approach when traditional detection mechanisms (e.g., based on event logs, probes and heartbeats) are inadequate or can...
Towards fast OS rejuvenation: An experimental evaluation of fast OS reboot techniques
2013 IEEE 24th International Symposium on Software Reliability Engineering (ISSRE)
By Antonio Bovenzi,Javier Alonso,Hiroshi Yamada,Stefano Russo,Kishor S. Trivedi
Issue Date:November 2013
Continuous or high availability is a key requirement for many modern IT systems. Computer operating systems play an important role in IT systems availability. Due to the complexity of their architecture, they are prone to suffer failures due to several typ...
Error detection framework for complex software systems
Found in: Proceedings of the 13th European Workshop on Dependable Computing (EWDC '11)
By Antonio Bovenzi, Domenico Cotroneo, Gabriella Carrozza, Roberto Pietrantuono
Issue Date:May 2011
Software systems employed in critical scenarios are increasingly large and complex. The usage of many heterogeneous components causes complex interdependences, and introduces sources of non-determinism, that often lead to the activation of subtle faults. S...
Original Search Engine
Need a Web Account?
Become a Member
This site and all contents (unless otherwise noted) are Copyright ©2008, IEEE, Inc. All rights reserved.