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Highs and lows of radiation testing
Found in: On-Line Testing Symposium, IEEE International
By Dan Alexandrescu, Anne-Lise Lhomme-Perrot, Erwin Schaefer, Cyrille Beltrando
Issue Date:June 2009
pp. 179
The presentation concerns a practical approach for dealing with difficulties associated to real time testing in a natural environment of microelectronic devices.
 
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