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Design techniques and tradeoffs in implementing non-destructive field test using logic BIST self-test
On-Line Testing Symposium, IEEE International
By Amit Dutta, Malav Shah, G. Swathi, Rubin A. Parekhji
Issue Date:June 2009
Periodic testing of electronic devices on the field during application execution is becoming increasingly important. In addition, some of these applications are embedded and real-time, requiring the system to be operational for extended periods. In such ap...
Enhancements in Deterministic BIST Implementations for Improving Test of Complex SOCs
VLSI Design, International Conference on
By Sandeep Jain, Jais Abraham, Srinivas Kumar Vooka, Sumant Kale, Amit Dutta, Rubin Parekhji
Issue Date:January 2007
Innovative solutions have been proposed to reduce the test cost of SOC designs. STUMPS (Self-Test Using PRPG and MISR Structures) architecture based logic BIST (Built-In Self- Test) is one such popular solution which attempts to reduce the cost of scan bas...
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