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Non-linear Bundle Adjustment for Electron Tomography
Found in: Computer Science and Information Engineering, World Congress on
By Sébastien Phan, James Bouwer, Jason Lanman, Masako Terada, Albert Lawrence
Issue Date:April 2009
pp. 604-612
High quality tomographic reconstruction from electron microscope images requires precise alignment of the images. This cannot be accomplished by simple 2D image transformations because the electron trajectories through the object are curvilinear. According...
 
Parallel Processing and Large-Field Electron Microscope Tomography
Found in: Computer Science and Information Engineering, World Congress on
By Albert Lawrence, Sébastien Phan, Rajvikram Singh
Issue Date:April 2009
pp. 339-343
We review some recent progress in improving the speed of electron microscope tomography through highly parallel algorithms implemented on parallel computers, clusters and graphics processor boards in desktop computers.
 
Tomography of Large Format Electron Microscope Tilt Series: Image Alignment and Volume Reconstruction
Found in: Image and Signal Processing, Congress on
By Sébastien Phan, Albert Lawrence
Issue Date:May 2008
pp. 176-182
Image alignment is a critical step in obtaining high quality reconstructions. Bundle adjustment, based on a general projective model, combined with calculation of the envelope of backprojected tangents to a surface of revolution around the rotation axis es...
 
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