Testing of Clock-Domain Crossing Faults in Multi-core System-on-Chip
Asian Test Symposium
By Naghmeh Karimi,Zhiqiu Kong,Krishnendu Chakrabarty,Pallav Gupta,Srinivas Patil
Issue Date:November 2011
Manufacturing test for clock-domain crossing(CDC) defects is a major challenge for multi-core system-on chip(SoC) designs in the nanometer regime. Setup- and hold time violations in flip-flops situated on clock boundaries may lead to catastrophic failures,...