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Testing of Clock-Domain Crossing Faults in Multi-core System-on-Chip
Found in: Asian Test Symposium
By Naghmeh Karimi,Zhiqiu Kong,Krishnendu Chakrabarty,Pallav Gupta,Srinivas Patil
Issue Date:November 2011
pp. 7-14
Manufacturing test for clock-domain crossing(CDC) defects is a major challenge for multi-core system-on chip(SoC) designs in the nanometer regime. Setup- and hold time violations in flip-flops situated on clock boundaries may lead to catastrophic failures,...
 
Random stimulus generation with self-tuning
Found in: International Conference on Computer Supported Cooperative Work in Design
By Yanni Zhao, Jinian Bian, Shujun Deng, Zhiqiu Kong
Issue Date:April 2009
pp. 62-65
Constrained random simulation methodology still plays an important role in hardware verification due to the limited scalability of formal verification, especially for the large and complex design in industry. There are two aspects to measure the stimulus g...
 
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