Registration Open for International Test Conference
LOS ALAMITOS, Calif., 22 July, 2011 – If you’re planning on attending the International Test Conference, consider submitting a paper to a workshop for a more focused audience. Three workshops will be held 22-23 September during the conference at the Disneyland Hotel in Anaheim, California. Submissions for the workshops are still open.
The 3D Test Workshop, which focuses on test of and design-for-test for three-dimensional stacked ICs (3D-SICs) is accepting submissions until 1 August.
The IEEE International Workshop on Silicon Debug and Diagnosis is the seventh of a series of highly successful technical workshops that consider issues related to debug and diagnosis of semiconductor circuits and systems – from prototype bring-up to volume production. The deadline date for SDD 2011 is also 1 August.
The IEEE International Workshop on Defect & Adaptive Test Analysis (DATA-2011) will discuss new avenues of research and development in the areas of extracting information about defects and IC behavior through the use of innovative analysis techniques. Extended abstracts can be submitted until 21 July.
To register for ITC, which will run from 18-23 September, visit http://itctestweek.org/.
International Test Conference, the cornerstone of TestWeek events, is the world's premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement.
At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.
TestWeek's comprehensive program includes papers, panels, lectures and advanced industrial practice sessions, tutorials, workshops, and the return of the famed poster session followed by a Texas-style beer blast.
The International Test Conference (ITC) is sponsored by the Test Technology Technical Council of the IEEE Computer Society and by the Philadelphia Section of the IEEE. This year marks the 42nd consecutive conference year for ITC.
From its beginnings as an informal gathering of test engineers in 1970 at Cherry Hill, New Jersey, ITC has grown to become the cornerstone of Test Week activities, which this year include more than 100 technical papers, panels, tutorials, lecture series, workshops, IEEE fringe meetings and important plenary and invited addresses. ITC has a tradition of spirited debate over test issues that continue during breaks and social gatherings. Over 100 companies participate.
About the IEEE Computer Society
With nearly 85,000 members, the IEEE Computer Society is the world’s leading organization of computing professionals. Founded in 1946, and the largest of IEEE’s 38 societies, the Computer Society is dedicated to advancing the theory and application of computer and information-processing technology. The Society serves the information and career-development needs of today’s computing researchers and practitioners with technical journals, magazines, conferences, books, conference publications, certifications, and online courses. For more information, visit http://www.computer.org.