Early Registration Extended for ITC

LOS ALAMITOS, Calif., 8 October, 2009 -- Significant discounts are still available for registering online for the IEEE Computer Society co-sponsored ITC Test Week now that the early registration deadline has been extended until 12 October.

Take advantage of the discounts and make your online hotel reservations. Test Week events will be held 1-6 November at the Austin Convention Center in Austin, Texas. View the Advance Program to find out more about the technical program, exhibits, and commemorative events taking place at ITC 2009.

The September/October issue of the IEEE Computer Society’s Design & Test of Computers magazine features a special section of updated articles from last year's ITC. Two are tutorials: “Mixed-Signal Production Test: A Measurement Principle Perspective” and “Statistics in Semiconductor Test: Going Beyond Yield.” A third article, "Multidimensional Test Escape Rate Modeling," presents a method for estimating the test escape rate of SoC devices.

International Test Conference, the cornerstone of TestWeek events, is the world's premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement.

At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.

TestWeek's comprehensive program includes papers, panels, lectures and advanced industrial practice sessions, tutorials, workshops, and the return of the famed poster session followed by a Texas-style beer blast.

In addition to focused papers on hot topics such as test compression, power-aware test, advances in delay test, and silicon debug, new this year are four embedded tutorials on topics including testing of 3D chips, new boundary-scan standards and post-silicon validation. Also new is a special Career Track hosted by IEEE-USA.

The International Test Conference (ITC) is sponsored by the Test Technology Technical Council of the IEEE Computer Society and by the Philadelphia Section of the IEEE. This year marks the 40th consecutive conference year for ITC.

From its beginnings as an informal gathering of test engineers in 1970 at Cherry Hill, New Jersey, ITC has grown to become the cornerstone of Test Week activities, which this year include more than 100 technical papers, panels, tutorials, lecture series, workshops, IEEE fringe meetings and important plenary and invited addresses. ITC has a tradition of spirited debate over test issues that continue during breaks and social gatherings. Over 100 companies participate.

ITC 2010 will also be held at the Austin Convention Center in Austin, Texas, on 2-4 November, 2010. Test Week will run 1-5 November, 2010.

Registration information is available online at http://www.itctestweek.org, or through the ITC office at +1 202.973.8665.

About the IEEE Computer Society

With nearly 85,000 members, the IEEE Computer Society is the world’s leading organization of computing professionals. Founded in 1946, and the largest of the 39 IEEE societies, the Computer Society is dedicated to advancing the theory and application of computer and information-processing technology. The Society serves the information and career-development needs of today’s computing researchers and practitioners with technical journals, magazines, conferences, books, conference publications, certifications and online courses.

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