Design & Test Editorial Board

Editor in Chief Emeritus
Tim Cheng is a professor of electrical and computer engineering at the University of California, Santa Barbara. His research interests include developing methodologies, algorithms, techniques, and tools for validating, verifying, testing and anlyzing system-on-chip (SoC) and 3D devices, and algorithms and techniques for multimedia applications. Cheng has a PhD in electrical engineering and computer science from University of California, Berkeley. He is a Fellow of the IEEE.

Editor in Chief Emeritus,
Departments: Conference Reports, Panel Summaries, Perspectives
D&T Alliance Program Chair
Yervant Zorian is vice president and chief scientist of Virage Logic, and chief technology advisor of LogicVision. His research interests include developing embedded test and repair strategies for IP cores, chips, and systems. Zorian has an MSc in computer engineering from the University of Southern California and a PhD in electrical engineering from McGill University. He is a Golden Core Member of the IEEE Computer Society, an honorary doctor of the National Academy of Sciences of Armenia, and a Fellow of the IEEE.

D&T Alliance Program: Europe
Bernard Courtois is director of CMP Service.  His research interests include CAD, and architecture and testing of integrated circuits and systems. Courtois has an engineer degree and PhD degrees in engineering and sciences from the Institut National Polytechnique de Grenoble, France. He is the founding director of Laboratory of Techniques of Informatics and Microelectronics for Computer Architecture (TIMA) and has been general chair of many international conferences and workshops. He is Doctor Honoris Causa of the Technical University of Budapest. Courtois is a Golden Core member of the IEEE Computer Society and a member of the ACM, ASME, IEEE, and IMAPS.

Department: DATC Newsletter
D&T Alliance Program: DATC
Joe Damore is an adjunct faculty member in the computer information systems department at Dutchess Community College in New York and a freelance webmaster. Previously, he worked for 36 years at IBM. Damore has an MS in industrial administration from Union College in Schenectady, New York. He is a member of IEEE and the ACM. 

Departments: The Last Byte, Book Reviews
Scott Davidson is senior staff engineer at Sun Microsystems. His research interests include system test and design for testability. Davidson has a BS from MIT, an MS from the University of Illinois at Urbana-Champaign, and a PhD from the University of Southwestern Louisiana, all in computer science. He is a member of the IEEE.

Department: Standards (Test)
Bill Eklow is a Distinguished Manufacturing Engineer at Cisco Systems. He works with design engineers, component suppliers, board and system integrators, and test engineers to identify and implement processes and tools which will improve the end-to-end quality of Cisco's products. Prior to joining Cisco, Eklow worked at Tandem Computers as a Senior Test Engineer/Test Architect. He has been involved in the test industry for more than 31 years and has been inolved with IEEE for more than 20 years. He is a senior member of the IEEE, a Golden Core member, and an Eta Kappa Nu member. 

Department: Tutorials
Dimitris Gizopoulos is a professor at the University of Athens, Greece, where he leads the Computer Systems Laboratory. His research interests include microprocessors and microprocessor-based systems dependable design, testing, on-line testing and fault tolerance. Gizopoulos has a PhD from the Department of Informatics and Telecommunications, University of Athens. He is a member of the IEEE and a Golden Core member of the IEEE Computer Society.

Department: CEDA
Rajesh Gupta is a professor and holder of the QUALCOMM endowed chair in Embedded Microsystems in the Department of Computer Science & Engineering at UC San Diego. His research interests include energy efficient and mobile computing issues in embedded systems. Gupta has a B. Tech in electrical engineering from IIT Kanpur, India, an MS in EECS from UC Berkeley, and a PhD in electrical engineering from Stanford University. Gupta is a Fellow of the IEEE and is a former editor in chief of IEEE Design & Test.

Technical Area: SoC Design
Soha Hassoun is an assistant professor in the Department of Computer Science at Tufts University. Her research interests include CAD, VLSI design, and computer architecture. Hassoun has a BS in electrical engineering from South Dakota State University, an MS in electrical engineering from the Massachusetts Institute of Technology, and a PhD in computer science and engineering from the University of Washington, Seattle. She is a member of the ACM, a senior member of the IEEE, and a Fellow of Tau Beta Pi.

Technical Area: Embedded Test Sybille Hellebrand is a professor of computer engineering at the University of Paderborn in Germany. Her research interests include test and diagnosis of microelectronic systems, in particular built-in test; built-in diagnosis, and built-in repair for systems-on-a-chip and networks-on-a-chip; and design and synthesis of testable and reliable circuits and systems. She has a PhD from the University of Karlsruhe, Germany, and was a postdoctoral fellow at the TIMA/IMAG-Computer Architecture Group in Grenoble, France. Hellebrand is also an associate editor for the Journal of Electronic Testing (JETTA)

Technical Area: Microelectronic IC Packaging
Bruce Kim is an associate professor in the Department of Electrical and Computer Engineering of the University of Alabama. His research interests include micro and nanosystems for RF and biological applications; mixed-signal and RF IC design; microelectronics IC packaging; VLSI design and verification; and VLSI algorithms and CAD. Kim has a BS in electrical engineering from the University of California, Irvine; an MS in electrical engineering from the University of Arizona; and a PhD in electrical and computer engineering from the Georgia Institute of Technology. He is a senior member of the IEEE.
 

Technical Area: Standards (Design)
Stan Krolikoski is Group Director, EDA/IP Standards & Interoperability at Cadence Design Systems. He has been involved in EDA Standards for more than 25 years and has served as a leader in organizations such as the IEEE, Accellera and The Open SystemC Initiative. He is currently Chair of the IEEE Design Automation Standards Committee. Dr. Krolikoski has worked at IBM, Honeywell, Compass, ChipVision and Cadence in various technical, managerial and executive roles. He has PhDs in philosophy and computer science from the University of Illinois at Urbana-Champaign, and a BA degree in philosophy from the Universiteit te Leuven (Belgium).

Technical Area: Logic and Physical Synthesis
David Kung is the Senior Manager of the Design Automation Department in IBM Research and is responsible for the Design Automation research strategy. His research interests are in all areas of CAD, with main focus in the area of logic and physical synthesis. He has a BA in physics from University of California, Berkeley, MA in physics from Harvard University, and a PhD in Physics from Stanford University. He is a senior member of the IEEE. 

Technical Area: Reconfigurable and Embedded Systems
Jan Madsen is a professor in computer-based systems at DTU Informatics at the Technical University of Denmark, where he heads the section on Embedded Systems Engineering. His research interests include design of embedded computer systems, in particular system-level modeling and analysis of multicore systems realized on a single chip, system-on-chip including RTOS modeling and hardware/software codesign, and design methodologies and implementations of embedded systems and wireless sensor networks, including  CAD tools. Madsen has a MSc in elecrical engineering and a PhD in computer science from the Technical University of Denmark. He is vice chairman of the board of IEEE Denmark Section.

Technical Area: SoC Testing
Erik Jan Marinissen is a Principal Scientist at IMEC in Leuven, Belgium. Previously, he worked at NXP Semiconductors and Philips Research in Eindhoven, The Netherlands. His research interests include all aspects of integrated circuit testing and design-for-test. Marinissen holds an MSc in Computing Science and a PDEng degree in Software Technology, both from Eindhoven University of Technology, The Netherlands.He is a Senior Member of IEEE and Golden Core Member of the Computer Society.

 Department: Book Reviews
Igor Markov is an associate professor of electrical engineering and computer science at the University of Michigan. His research interests include physical design, logic synthesis, verification, test, and emerging technologies for computing. Markov has a PhD in computer science and an MA in mathematics from UCLA. He is member of IEEE and ACM.

  Department: Book Reviews
Grant Martin is a Chief Scientist at Tensilica, Inc. in Santa Clara, California. His reseacrh interests include system-level design, IP-based design or system-on-chip, platform-based design, and embedded software. He has a MS and BS in Mathematics (Combinatorics and Optimisation) from the University of Waterloo, Canada. Martin is Senior Member of the IEEE.

 Technical Area: Embedded Real-Time Systems
Prabhat Mishra is an associate professor in the Department of Computer and Information Science and Engineering at University of Florida. His research interests include design automation of embedded and real-time systems, low-power reconfigurable architectures, and high-level validation of SoC designs. Mishra has a BE from Jadavpur University, an MS from Indian Institute of Technology, Kharagpur, and a PhD from University of California, Irvine, all in computer science. He is a senior member of the IEEE and a senior member of ACM.

Technical Area: Deep-Submicron IC
Design and Analysis
Sani Nassif is the manager of the Tools and Technology department at the IBM Austin Research Laboratory. As such, he oversees research in CAD, computer-aided verification, testing, design for manufacturability, and thermoelectric cooling. The CAD work includes transistor-level simulation, analysis, and optimization (sizing); algorithms for placement, buffer insertion, and wire and buffer sizing; and power grid analysis. Dr. Nassif has a BA in electrical engineering from the American University of Beirut, and an MS and a PhD in electrical and computer engineering from Carnegie Mellon University. He is a senior member of the IEEE.

Technical Area: Silicon Debug Nicola Nicolici is associate professor in the Department of Electrical and Computer Engineering at McMaster University. His research interests are in design methods and algorithms for digital integrated circuits and systems. He has contributed primarily to the fields of manufacturing test and post-silicon validation and debug. His recent focus has shifted toward robust system design, energy-efficiency in electronic systems, and hardware acceleration for scientific computing. He has a PhD in electronics and computer science from the University of Southampton, UK. He is a member of the IEEE, ACM, and Test Technology Technical Council.

D&T Alliance Program: Asia
Hidetoshi Onodera is a professor in the Department of Communications and Computer Engineering at Kyoto University, Japan. His research interests include EDA and design methods for digital/analog/RF circuits, design for high speed and low power, and design for manufacturability. Onodera has a BE, an ME, and a DEng, all in electronic engineering, from Kyoto University. He is a member of the IEEE, the ACM, IEICE Japan, and IPS Japan.

Department: TTTC Newsletter
Partha Pande is an assistant professor in the school of Electrical Engineering and Computer Science at Washington State University. His research interests include the broad topics of network on chip. Pande has a PhD in electrical and computer engineering from the University of British Columbia and andMS in computer science from National University of Singapore.

Technical Area: Low Power
Anand Raghunathan is a a professor of electrical and computer engineering at Purdue University. His research interests include SoC architectures, design methodologies, and design tools, with an emphasis on high-performance, low-power, and testable designs. Raghunathan has a Btech in electrical and electronics engineering from the Indian Institute of Technology, Madras, India; and an MA and PhD in electrical engineering from Princeton University. He is a senior member of the IEEE, a member of the VLSI Test Symposium organizing committee, and vice chair of the Test Technology Technical Council's Tutorials & Education Group.

Department: Standards
Jeff Rearick is a Fellow at Advanced Micro Devices who leads AMD's Design for Testability Center of Expertise. His research interests include at-speed testing, delay test methodologies, and the design of instrumentation for measuring timing performance. Rearick has a MS in electrical engineering from Illinois University and a BS in electrical engineering from Purdue University. He is a member of the ITC program committee and has been active on two IEEE standards committees.

Department: Perspectives
Alberto Sangiovanni-Vincentelli holds the Edgar L. and Harold H. Buttner Chair of Electrical Engineering and Computer Sciences at the University of California, Berkeley. His research interests include design tools and methodologies, large-scale systems, embedded controllers, and hybrid systems. Sangiovanni-Vincentelli has a DrIng in electrical engineering and computer science from Politecnico di Milano, Italy. He is a cofounder of Cadence and Synopsys, an IEEE Fellow, and a member of the National Academy of Engineering.

Technical Area: Performance Issues in IC Design
Sachin Sapatnekar is a professor in the Department of Electrical and Computer Engineering at the University of Minnesota where he holds the Robert and MarjorieHenle chair and the Distinguished McKnight University professorship. His research interests include developing efficient techniques for computer-aided design of integrated circuits and is primarily centered around physical design, timing and simulation issues, and optimization algorithms. Sapatnekar has a B. Tech. from the Indian Institute of Technology, Bombay, an MS from Syracuse University, and a PhD from the University of Illinois at Urbana-Champaign. He is a Fellow of the IEEE.  

Technical Area: Defect-Based Test
Adit Singh is James B. Davis professor of electrical and computer engineering at Auburn University. His reseacrh interests include high performance VLSI systems, IC and SOC testing, and microelectronic system and reliability and fault tolerance. Singh has a B. Tech from IIT Kanpur,a nd an MS and PhD from Virginia Tech, all in electrical engineering. He is Fellow of the IEEE.

Technical Area: Hardware Trust and Secure ICs
Mohammad Tehranipoor is an assistant professor of electrical and computer engineering at the University of Connecticut. His research interests include CAD and test for CMOS VLSI designs, design-for-testability, reliability, secure design, and IC/IP trust. Tehranipoor has a BS from Amirkabir University of Technology, an MSc from the University of Tehran, and a PhD from the University of  Texas, Dallas all in electrical engineering. He is a Senior Member of the IEEE and member of ACM and ACM SIGDA.

Anthony Ambler is dean of engineering at the University of South Carolina. His research interests include economics of test for complex devices, boards and systems, DFT, and safety-critical systems. He has phD, MS, and BS from the University of Manchester Institute of Science and Technology. Ambler is a Golden Core member of the IEEE Computer Society and a Fellow of the IEEE.

Yervant Zorian is vice president and chief scientist of Virage Logic, and chief technology advisor of LogicVision. His research interests include developing embedded test and repair strategies for IP cores, chips, and systems. Zorian has an MSc in computer engineering from the University of Southern California and a PhD in electrical engineering from McGill University. He is a Golden Core Member of the IEEE Computer Society, an honorary doctor of the National Academy of Sciences of Armenia, and a Fellow of the IEEE.