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Issue No.06 - November/December (vol.27)
ISSN: 0740-7475
TABLE OF CONTENTS
Toc
From the EIC
Call for Papers
Guest Editors' Introduction
Postsilicon Calibration and Repair for Yield and Reliability Improvement
Shreyas Sen , Georgia Institute of Technology
Aritra Banerjee , Georgia Institute of Technology
Abhijit Chatterjee , Georgia Institute of Technology
Ganesh Srinivasan , Texas Instruments
Friedrich Taenzler , Texas Instruments
pp. 6-17
Wu-Hsin Chen , Purdue University
Byunghoo Jung , Purdue University
pp. 18-25
Jason Schlessman , Princeton University
Hamid Mahmoodi , San Francisco State University
Marilyn Wolf , Georgia Institute of Technology
Saibal Mukhopadhyay , Georgia Institute of Technology
pp. 26-35
Rajiv Joshi , IBM Corporation,
Rouwaida Kanj , IBM, round Rock
Anthony Pelella , IBM Corporation,
Arthur tuminaro , IBM Corporation,
Yuen Chan , IBM Corporation,
pp. 36-45
Jin-Fu Li , National Central University
Tsu-Wei Tseng , National Central University
pp. 46-57
Mohammad Al Faruque , CES:Chair for Embedded Systems , Karlsruhe
Janmartin Jahn , Karlsruhe Institute of Technology, Karlsruhe
Joerg Henkel , University of Karlsruhe, Karlsruhe
pp. 58-68
Conference Reports and Panel Summaries
Book Reviews
CEDA Currents
DATC Newsletter
TTTC Newsletter
The Last Byte
pp. 80
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