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Issue No.01 - January/February (vol.27)
ISSN: 0740-7475
TABLE OF CONTENTS
Call for Papers
From the EIC
Verifying Physical Trustworthiness of ICs and Systems
Yier Jin , Yale University
Yiorgos Makris , Yale University
pp. 26-35
Kurt Rosenfeld , Polytechnic Institute of New York University
pp. 36-47
Feature Article
Lingkan Gong , East China Institute of Computer Technology
Jingfen Lu , East China Institute of Computer Technology
pp. 76-85
CEDA Currents
DATC Newsletter
TTTC Newsletter
Conference Reports
Book Reviews
Igor Markov , University of Michigan
pp. 93-95
The Last Byte
Miodrag Potkonjak , University of California, Los Angeles
pp. 96-98