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Issue No.03 - May/June (vol.26)
ISSN: 0740-7475
TABLE OF CONTENTS
From the EIC
Call for Papers
Special Issue
IEEE Std 1500 and Its Usage - Part 2
Alfredo Benso , Politecnico di Torino
Paolo Prinetto , Politecnico di Torino
pp. 16-24
Susanne Graf , Verimag
Albert Benveniste , INRIA Rennes
Daniela Cancila , CEA LIST
Arnaud Cuccuru , CEA LIST
Francois Terrier , CEA LIST
Werner Damm , Oldenburg University
Alberto Ferrari , Parades
Roberto Passerone , University of Trento
Alberto Sangiovanni-Vincentelli , University of California, Berkeley
pp. 38-53
Sandeep Kumar Shukla , Virginia Polytechnic and State University
Janos Sztipanovits , Vanderbilt University
Guang Yang , National Instruments
pp. 54-69
Other Features
Jan Schat , NXP Semiconductors
Frank van der Heyden , NXP Semiconductors
Vladimir A. Zivkovic , NXP Semiconductors
pp. 78-86
Departments
Sandeep Shukla , Virginia Tech
pp. 96
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