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Issue No.02 - March-April (2007 vol.24)
pp: 202-203
C.P. Ravikumar , Texas Instruments
Jari Nurmi , Tampere University of Technology
ABSTRACT
1. TTTC Forum honors Melvin Breuer--at the 2006 International Test Conference, a half-day technical forum was held to honor Melvin Breuer, a pioneer in the areas of VLSI design automation and test; 2. Design flow and methodology addressed at SOC 2006--The International Symposium on System-on-Chip took place on 13-16 November 2006 in Tampere, Finland. The theme was "SoC Design Flow and Methodology." There were nine high-caliber, 45-minute invited talks, covering different approaches and application areas in SoC design.
INDEX TERMS
Melvin Breuer, ITC, SOC 2006, SoC design
CITATION
C.P. Ravikumar, Jari Nurmi, "Conference Reports", IEEE Design & Test of Computers, vol.24, no. 2, pp. 202-203, March-April 2007, doi:10.1109/MDT.2007.39
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