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Issue No.06 - November/December (vol.21)
ISSN: 0740-7475
TABLE OF CONTENTS
Special Features
EIC Message
Rajesh Gupta , Editor in Chief, <em>IEEE Design & Test</em>
pp. 457
Features
Martin Zambaldi , Infineon Technologies
Renate Henftling , Infineon Technologies
Matthias Bauer , Infineon Technologies
pp. 464-471
Yuan Yu , Microsoft Research
pp. 472-482
Young-Il Kim , Korea Advanced Institute of Science and Technology
Chong-Min Kyung , Korea Advanced Institute of Science and Technology Integrated Circuit Design Education Center
pp. 484-493
Special Features
Paolo Ienne , Swiss Federal Institute of Technology Lausanne
Patrick Thiran , Swiss Federal Institute of Technology Lausanne
Giovanni De Micheli , Stanford University
pp. 524-535
Marcel A. Kossel , IBM Zurich Research Laboratory
pp. 536-543
Sunjaya Djaja , Simon Fraser University
Desmond Y.H. Cheung , Simon Fraser University
Yves Audet , Ecole Polytechnique, Montreal
Israel Koren , University of Massachusetts, Amherst
Zahava Koren , University of Massachusetts, Amherst
pp. 544-551
Gustavo Neuberger , Federal University of Rio Grande do Sul
Fernanda Gusmao de Lima Kastensmidt , State University of Rio Grande do Sul
Luigi Carro , Federal University of Rio Grande do Sul
Ricardo Reis , Federal University of Rio Grande do Sul
pp. 552-562
Bipul C. Paul , Purdue University
pp. 563-571
Yongseok Choi , Seoul National University
Youngjin Cho , Seoul National University
Ikhwan Lee , Samsung Electronics
Hyeonmin Lim , Seoul National University
Hyung Gyu Lee , Seoul National University
Hojun Shim , Seoul National University
Naehyuck Chang , Seoul National University
pp. 572-586
Departments
Book Reviews (HTML)
pp. 590-591
Victor Berman , Cadence Design Systems
pp. 592-593
Conference Reports (Abstract)
Raimund Ubar , Tallinn University of Technology
Vladimir Hahanov , Kharkov National University of Radio Electronics
pp. 594-595
DATC Newsletter (Abstract)
pp. 596
The Last Byte
Design illiteracy (Abstract)
Scott Davidson , Sun Microsystems
pp. 608
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