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Issue No.05 - September/October (vol.21)
ISSN: 0740-7475
EIC Message
Rajesh Gupta , Editor in Chief, <em>IEEE Design & Test</em>
pp. 345
Conference Reports
Samarjit Chakraborty , National University of Singapore
Alexander Maxiaguine , Swiss Federal Institute of Technology
Lothar Thiele , Swiss Federal Institute of Technology
pp. 368-377
Francky Catthoor , IMEC and Katholieke Universiteit Leuven
Davide Bruni , University of Bologna
Luca Benini , University of Bologna
Jos? Ignacio G?mez , Universidad Complutense de Madrid
Luis Pi?uel , Universidad Complutense de Madrid
pp. 378-387
Hojun Shim , Seoul National University
Naehyuck Chang , Seoul National University
Massoud Pedram , University of Southern California
pp. 388-396
Manev Luthra , University of California Irvine
Shivajit Mohapatra , University of California Irvine
Nikil Dutt , University of California Irvine
Nalini Venkatasubramanian , University of California Irvine
pp. 398-405
J? Henkel , NEC Laboratories America
Srimat Chakradhar , NEC Laboratories America
Haris Lekatsas , NEC Laboratories America
pp. 406-415
Special Features
Nikolaos Papandreou , Computer Technology Institute
Maria Varsamou , University of Patras
pp. 416-428
Ad J. van de Goor , Delft University of Technology
pp. 430-440
Scott Davidson , Sun Microsystems
pp. 448-449
Scott Davidson , Sun Microsystems
pp. 456
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