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Issue No.01 - January/February (vol.4)
ISSN: 0740-7475
TABLE OF CONTENTS
Papers
Randy Katz , University of California, Berkeley
Rajiv Bhateja , University of California, Berkeley
Ellis Chang , University of California, Berkeley
David Gedye , University of California, Berkeley
Vony Trijanto , University of California, Berkeley
pp. 12-22
Sy-yen Kuo , University of Illinois
W. Fuchs , University of Illinois
pp. 24-31
Hiroyuki Watanabe , University of North Carolina Bryan Ackland, AT&T Bell Laboratories
pp. 32-41
Kewal Saluja , University of Wisconsin
Siew Sng , Reliability Singapore
Kozo Kinoshita , Hiroshima University
pp. 42-51
Sudhakar Reddy , University of Iowa
R. Dandapani , University of Colorado
pp. 52-54
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