Digital Signature Proposal for Mixed-Signal Circuits

I
ITC
2000
International Test Conference 2000 (ITC'00)
Abstract - Digital Signature Proposal for Mixed-Signal Circuits

	This Article
	Subscribers, please Login Purchase article: $19 PDF IEEE Xplore Subscribers RSS feed
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by Anna Maria Brosa Articles by Joan Figueras

International Test Conference 2000 (ITC'00)

Atlantic City, NJ, USA

October 03-October 05

ISBN: 0-7803-6546-1

	ASCII Text	x
	Anna Maria Brosa, Joan Figueras, "Digital Signature Proposal for Mixed-Signal Circuits," Test Conference, International, pp. 1041, International Test Conference 2000 (ITC'00), 2000.

	BibTex	x
	@article{ 10.1109/TEST.2000.894317, author = {Anna Maria Brosa and Joan Figueras}, title = {Digital Signature Proposal for Mixed-Signal Circuits}, journal ={Test Conference, International}, volume = {0}, year = {2000}, issn = {1089-3539}, pages = {1041}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2000.894317}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Test Conference, International TI - Digital Signature Proposal for Mixed-Signal Circuits SN - 1089-3539 SP EP A1 - Anna Maria Brosa, A1 - Joan Figueras, PY - 2000 KW - Analog Test KW - Mixed-Signal Test KW - BIST. VL - 0 JA - Test Conference, International ER -

Anna Maria Brosa, Electronics Dept. Universitat Polit?cnica de Catalunya

Joan Figueras, Electronics Dept. Universitat Polit?cnica de Catalunya

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2000.894317

A new Built-In Self-Test structure, based on the information provided by the XY-operation (Lissajous curves) is introduced in this paper. A Digital Signature is obtained which is used to discriminate catastrophic as well as parametric defects. High Fault Coverage is achieved when applying the proposed BIST on an ITC'97 benchmark circuit where 92% of the catastrophic defects and 87.5% of the parametric defects analyzed produced digital signatures clearly distinguishable from the golden signature.

Index Terms:

Analog Test, Mixed-Signal Test, BIST.

Citation:

Anna Maria Brosa, Joan Figueras, "Digital Signature Proposal for Mixed-Signal Circuits," itc, pp.1041, International Test Conference 2000 (ITC'00), 2000

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.