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Table of Contents
Peter Kornerup, University of Southern Denmark, Odense, Denmark
Paolo Montuschi, Politecnico di Torino, Torino, Italy
Jean-Michel Muller, CNRS, Université de Lyon, France
Eric Schwarz, IBM Corporation, NY pp. 145-147
Marius Cornea, Intel Corporation, Hillsboro
John Harrison, Intel Corporation, Hillsboro
Cristina Anderson, Intel Corporation, Hillsboro
Ping Tak Peter Tang, Intel Corporation, Hillsboro
Eric Schneider, Intel Corporation, Hillsboro
Evgeny Gvozdev, Intel Corporation, Hillsboro pp. 148-162
Alexandru Fit-Florea, Advanced Micro Devices, Inc., Sunnyvale
Lun Li, Texas Instruments, Dallas
Mitchell A. Thornton, Southern Methodist University, Dallas
David W. Matula, Southern Methodist University, Dallas pp. 163-174
Dimitri Tan, Advanced Micro Devices Inc., Austin
Carl E. Lemonds, Advanced Micro Devices Inc., Austin
Michael J. Schulte, University of Wisconsin-Madison, Madison pp. 175-187
Dong-Guk Han, Electronics and Telecommunications Research Institute, Daejeon
Dooho Choi, Electronics and Telecommunications Research Institute, Daejeon
Howon Kim, Pusan National University, Korea pp. 188-196
Christoph Quirin Lauter, École Normale Supérieure de Lyon, Lyon
Vincent Lefèvre, LIP ENS Lyon INRIA, Lyon pp. 197-207
Pipelining Saturated Accumulation (Abstract)
Karl Papadantonakis, Myricom, Arcadia
Nachiket Kapre, CALTECH, Pasadena
Stephanie Chan, Numerica Corp., Loveland
André DeHon, University of Pennsylvania, Philadelphia pp. 208-219
Sylvie Boldo, INRIA, ORSAY pp. 220-225
Marc Daumas, ELIAUS, UPVD, Perpignan
David Lester, University of Manchester, Manchester
Céar Muñoz, National Institute of Aerospace, Hampton pp. 226-237
Chuan-Ching Sue, National Cheng Kung University, Tainan pp. 238-250
Using Node Diagnosability to Determine t-Diagnosability under the Comparison Diagnosis Model (Abstract)
Chieh-Feng Chiang, National Chiao Tung University, Hsinchu
Jimmy J.M. Tan, National Chiao Tung University, Hsinchu pp. 251-259
Deng Pan, Florida International University, Miami
Yuanyuan Yang, State University of New York, Stony Brook pp. 260-274
Sriram C. Krishnan, Cisco Systems Inc, San Jose
Rina Panigrahy, Microsoft Research, Mountain View
Sunil Parthasarathy, Cisco Systems Inc, San Jose pp. 275-279
Enrico Bini, Scuola Superiore Sant'Anna, Pisa
Thi Huyen Châu Nguyen, University of Poitiers, Poitiers
Pascal Richard, University of Poitiers, Poitiers
Sanjoy K. Baruah, University of North Carolina, Chapel Hill pp. 279-286
R. M. Hierons, Brunel University, Uxbridge, Middlesex
H. Ural, University of Ottawa, Ottawa pp. 287-287 Usage of this product signifies your acceptance of the Terms of Use.
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