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The Ninth International Symposium on Software Reliability Engineering Paderborn, Germany November 04-November 07 ISBN: 0-8186-8991-9 Table of Contents
pp. 2 pp. 3
pp. 11 pp. 22
A Comparison and Integration of Capture-Recapture Models and the Detection Profile Method (Abstract)
Lionel C. Briand, Fraunhofer Institute for Experimental Software Engineering
Khaled El Emam, Fraunhofer Institute for Experimental Software Engineering
Bernd G. Freimut, Fraunhofer Institute for Experimental Software Engineering pp. 32
On the Inadequacy of Ordinary Preconditions for the Practical Design and Verification of Programs (Abstract)
Robert L. Baber, University of the Witwatersrand pp. 43 pp. 49 pp. 59
Per Runeson, Lund University
Björn Regnell, Lund University pp. 70 pp. 80 pp. 90
pp. 106
Pragmatic Study of Parametric Decomposition Models for Estimating Software Reliability Growth (Abstract)
Chin-Yu Huang, National Taiwan University
Jung-Hua Lo, National Taiwan University
Sy-Yen Kuo, National Taiwan University pp. 111 pp. 124 pp. 134
Michele Pizza, City University of London
Lorenzo Strigini, City University of London pp. 144 pp. 154 pp. 164 pp. 174
pp. 381
Mobile Agent Security and Reliability (Abstract)
pp. 181 pp. 182
Protecting Mobile Code (Abstract)
pp. 183
Lightweight Guided Random Simulation (Abstract)
pp. 185 pp. 192 pp. 202 Panel: Achieving Adequate Levels of Reliability in Practice: Issues and Strategies
Testing Production System Programs (Abstract)
Grigoris Antoniou, Griffith University
Oliver Jack, Universit?t-GH Paderborn pp. 214 pp. 222 pp. 231
pp. 237 pp. 247
Software Diagnosability (Abstract)
pp. 257
Veena B. Mendiratta, Lucent Technologies pp. 268
W. Eric Wong, Bellcore
Joseph R. Horgan, Bellcore
Michael Syring, Motorola
Wayne Zage, Ball State University pp. 273 pp. 283 pp. 293
pp. 306
Exploring Defect Data from Development and Customer Usage on Software Modules over Multiple Releases (Abstract)
pp. 316
pp. 322 pp. 334 pp. 344
Using Statistics of the Extremes for Software Reliability Analysis of Safety Critical Systems (Abstract)
pp. 355 pp. 364 pp. 369
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