8 to 10 November 2005: IEEE International Test Conference (including 45 sessions with 139 technical papers and six special lecture series) in Austin, Texas.
10 to 11 November 2005: IEEE Electronic System Test Workshop, 2nd IEEE GHz/Gbps Test Workshop, and IEEE Electronic System Test Workshop in Austin, Texas.
18 to 21 December 2005: 14th IEEE Asian Test Symposium in Kolkata, India.
The TTTC congratulates all of the following recipients.
International Test Conference (ITC 05) Best Paper Award
Kenneth P. Parker received the ITC Ned Kornfield Best Paper Award for his paper, "A New Probing Technique for High-Speed/High-Density Printed Circuit Board."
IEEE Emanuel R. Piore Award
Jacob A. Abraham received the IEEE Emanuel R. Piore Award "for contributions to the development of reliable and testable computer hardware systems."
Charles E. Stroud Named IEEE Fellow
Charles E. Stroud is the new IEEE Fellow "for contributions to built-in self-test of integrated circuits."
Olga Melnikova Receives Gerald W. Gordon Award
Olga Melnikova from Kharkov National University of Radio Electronics received the 2005 Gerald W. Gordon Award. The Gordon Award for student volunteer service aims to encourage student volunteers of the IEEE and its test community, the Test Technology Technical Council (TTTC). The award honors the memory of Gerald W. Gordon, a well-known leader and activist in the IEEE and the TTTC, and a longtime member of the ITC steering committee. The nomination deadline is July of each year. Contact the TTTC office at tttc@computer.org for details.
Test Technology Educational Program (TTEP 06)
http://tab.computer.org/tttc/teg/ttep
The Tutorials and Education Group of the IEEE Computer Society's TTTC organizes the Test Technology Educational Program (TTEP), a comprehensive set of test technology tutorials to be held in conjunction with TTTC-sponsored technical meetings. The IEEE Computer Society credits participation in TTEP-organized tutorials: Each full-day tutorial corresponds to four TTEP units. Upon completion of each 16 units, participants receive official accreditation in the form of the IEEE TTTC Test Technology Certificate.
The 2006 TTEP tutorials program has planned the following technical meetings for 2006:
Design Automation and Test in Europe Conference (DATE 06): 6 to 10 March, Munich, Germany;
Latin American Test Workshop (LATW 06): 26 to 29 March, Buenos Aires, Argentina;
VLSI Test Symposium (VTS 06): 30 April to 4 May, Berkeley, California;
Signal Propagation on Interconnects Workshop (SPI 06): 9 to 12 May, Potsdam, Germany;
European Test Symposium (ETS 06): 21 to 25 May, Southampton, United Kingdom;
International On-Line Testing Symposium (IOLTS 06): 10 to 12 July, Como, Italy;
International Test Conference (ITC 06): 23 to 27 October, Santa Clara, California; and
Asian Test Symposium (ATS 06): 20 to 23 November, Fukuoka, Japan.
9th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS 06)
18-21 April 2006
Prague, Czech Republic
http://ddecs06.felk.cvut.cz/
The IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems provides a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of microelectronic circuits and systems. Submissions deadline: 15 January 2006.
IEEE International Workshop on Open Source Test Technology Tools
30 April 2006
Berkeley, Calif.
http://IOST3.org
Submissions deadline: 16 January 2006.
15th IEEE North Atlantic Test Workshop (NATW 06)
10-12 May 2006,
Essex Junction, Vt.
http://www.ece.duke.edu/NATW/
This workshop will feature the Best Student Presentation Award. Students are encouraged to submit papers to NATW 2006. Submissions deadline: 20 February 2006.
IEEE International Conference on Automation, Quality and Testing, and Robotics (AQTR 06)
17-20 May 2006
Cluj-Napoca, Romania
http://conference.utcluj.ro/aqtr2006/
Submissions deadline: 6 February 2006.
11th IEEE European Test Symposium (ETS 06)
21-25 May 2006
Southampton, UK
http://www.ieee-ets.org/
IEEE 2nd European Workshop on Board Test (EBTW 06)
24-25 May 2006
Southampton, UK.
http://www.molesystems.com/EBTW06/
Submissions deadline for full papers or extended abstracts: 25 February 2006.
IEEE 12th International On-Line Testing Symposium (IOLTS 06)
10-12 July 2006.
Lake of Como, Italy
http://tima.imag.fr/conferences/iolts
Submissions deadline: 3 February 2006.
IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 06)
2-4 August 2006
Taipei, Taiwan
http://larc.ee.nthu.edu.tw/~mtdt06/
Submissions deadline: 25 March 2006.
IEEE East-West Design & Test Workshop (EWDTW 06)
15-19 September 2006
Sochi, Russia
http://www.ewdtest.com/conf/
EWDTW encourages the exchange of experiences between the scientific schools and experts of Eastern and Western Europe, the US, and other parts of the world in the fields of design, design automation, and test of electronic systems. Submissions deadline: 15 June 2006.
The 15th Asian Test Symposium
20-23 November 2006
Fukuoka, Japan
http://ats06.cs.ehime-u.ac.jp/
Submissions deadline for regular session papers: 7 May 2006.
Newsletter editor's invitation
I would appreciate input and suggestions from the test community about the content of each newsletter. Please forward your ideas, contributions, and information on awards, conferences, and workshops to Bruce C. Kim, Dept. of Electrical and Computer Engineering, Univ. of Alabama, 317 Houser Hall, Tuscaloosa, AL 35487-0286; bruce.kim@ieee.org.
Bruce C. Kim
Editor, TTTC Newsletter
For more details and free membership, browse the TTTC Web page: http://tab.computer.org/tttc/.
CONTRIBUTIONS TO THIS NEWSLETTER: Send contributions to Bruce C. Kim, Dept. of Electrical and Computer Engineering, Univ. of Alabama, 317 Houser Hall, Tuscaloosa, AL 35487-0286; bruce.kim@ieee.org. For more information, see the TTTC Web page: http://tab.computer.org/tttc/.
DOWNLOAD PDF